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| SML60EUZ06B Enhanced Ultrafast Recovery Diode 600 Volt, 60Amp TECHNOLOGY Back of Case Cathode The planar passivated and enhanced ultrafast recovery diode features a triple charge control action utilising Semelab's Graded Buffer Zone technology combined with SML 60EUZ06B low emitter efficiency and local lifetime control techniques. 1 - Cathode 2 - Anode BENEFITS * Very fast recovery for low switching losses * Ultra soft recovery with low EMI generation * High dynamic ruggedness under all conditions * Low temperature dependency * Low on-state losses with positive temperature coefficient * Stable blocking voltage and low leakage current * Avalanche rated for high reliability circuit operation 1 2 See Package outline for mechanical data and more details TO-247 PACKAGE Key Parameters VR VF IF trr (max) (typ) (max) (max) 600V 2.1V 60A 45ns APPLICATIONS * Freewheeling Diode for IGBTs and MOSFETs * Uninterruptible Power Supplies UPS * Switch Mode Power Supplies SMPS * Inverse and Clamping Diode * Snubber Diode * Fast Switching Rectification ABSOLUTE MAXIMUM RATINGS (Tcase = 25C unless otherwise stated) VRRM VR IFAV IFSM(surge) IFS(surge) PD WAVL TJ ,TSTG Peak Repetitive Reverse Voltage DC Reverse Blocking Voltage Average Forward Current @Tc = 85C Repetitive Forward Current Non-Repetitive Forward Current Power Dissipation @Tc = 85C Avalanche Energy Operating & Storage Junction Temperature 600V 600V 60A 150A 600A 130W 40mJ -55 to 150C Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 2386 Issue 1 SML60EUZ06B ELECTRICAL CHARACTERISTICS Parameter STATIC ELECTRICAL CHARACTERISTIC (Tcase = 25C unless otherwise stated) Test Conditions IF = 60A Tj = 25C Tj = 125C Tj = 25C Tj = 25C Tj = 125C Tj = 25C Min. Typ. 2.1 2.15 1.65 1.2 0.75 82 0.88 26 68 1.72 39 88 45 Max. 2.5 Unit VF Forward Voltage Drop IF = 60A IF = 30A VR = 600V VR = 600V VR = 200V V 400 5 A mA pF C A nsec C A nsec nsec IR CT Qrr Irr trr Qrr Irr trr trr Leakage Current Junction Capacitance Reverse Recovery Charge Reverse Recovery Current Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current Reverse Recovery Time Reverse Recovery Time DYNAMIC ELECTRICAL CHARACTERISTIC VR = 300V di / dt = 800A/s VR = 300V di / dt = 800A/s VR = 50V di / dt = 100A/s IF = 60A TJ = 25C IF = 60A TJ = 125C IF = 1A TJ = 25C THERMAL AND MECHANICAL CHARACTERISTICS Junction to Case Thermal Resistance Rjc TL LS Torque Lead Temperature Stray Inductance Mounting Torque 10 0.6 300 1.1 C/W C nH N.m T O -2 4 7 c lip P a c k a g e 4 .6 9 (.1 8 5 ) 5 .3 1 (.2 0 9 ) 1 .4 9 (.0 5 9 ) 2 .4 9 (.0 9 8 ) 6 .1 5 (.2 4 2 ) BSC C a th o d e 1 5 .4 9 (.6 1 0 ) 1 6 .2 6 (.6 4 0 ) 5 .3 8 (.2 1 2 ) 6 .2 0 (.2 4 4 ) 2 0 .8 0 (.8 1 9 ) 2 1 .4 6 (.8 4 5 ) 1 2 3 .5 0 (.1 3 8 ) 3 .8 1 (.1 5 0 ) 4 .5 0 (.1 7 7 ) MAX 0 .4 0 (.0 1 6 ) 0 .7 9 (.0 3 1 ) 1 9 .8 1 (.7 8 0 ) 2 0 .3 2 (.8 0 0 ) 1 .0 1 (.0 4 0 ) 1 .4 0 (.0 5 5 ) 1 .6 5 (.0 6 5 ) 3 .8 1 (.1 5 0 ) 2 -Anode 1 - C a th o d e 2 .2 1 (.0 8 7 ) 2 .5 9 (.1 0 2 ) 1 0 .9 0 (.4 3 0 ) B S C D im e n s io n s in M illim e te r s a n d (In c h e s ) Semelab Plc reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. E-mail: sales@semelab.co.uk Website: http://www.semelab.co.uk Document Number 2386 Issue 1 |
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